Transmission electron microscopy : physics of image formation and microanalysis

書誌事項

Transmission electron microscopy : physics of image formation and microanalysis

Ludwig Reimer

(Springer series in optical sciences, v. 36)

Springer-Verlag, c1993

3rd ed

  • : gw
  • : us

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注記

Bibliography: p. [465]-533

Includes index

内容説明・目次

内容説明

This stuy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of the particle-and wave-optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analyzed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure determination and the imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. This third edition includes a brief discussion of Schottky emission guns, some clarification of minor details, and references to the recent literature.

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詳細情報

  • NII書誌ID(NCID)
    BA21232223
  • ISBN
    • 3540568492
    • 0387568492
  • 出版国コード
    gw
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Berlin ; Tokyo
  • ページ数/冊数
    xiii, 545 p.
  • 大きさ
    24 cm
  • 分類
  • 件名
  • 親書誌ID
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