Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A.

Bibliographic Information

Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A.

editors, Kenneth P. Rodbell ... [et al.]

(Materials Research Society symposium proceedings, v. 309)

Materials Research Society, c1993

Available at  / 8 libraries

Search this Book/Journal

Note

Includes bibliographical references and index

Description and Table of Contents

Description

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

by "Nielsen BookData"

Related Books: 1-1 of 1

Details

Page Top