Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A.

書誌事項

Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A.

editors, Kenneth P. Rodbell ... [et al.]

(Materials Research Society symposium proceedings, v. 309)

Materials Research Society, c1993

大学図書館所蔵 件 / 8

この図書・雑誌をさがす

注記

Includes bibliographical references and index

内容説明・目次

内容説明

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

「Nielsen BookData」 より

関連文献: 1件中  1-1を表示

詳細情報

ページトップへ