Optical characterization of semiconductors : infrared, raman, and photoluminescence spectroscopy

書誌事項

Optical characterization of semiconductors : infrared, raman, and photoluminescence spectroscopy

Sidney Perkowitz

(Techniques of physics, 14)

Academic, c1993

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内容説明・目次

内容説明

This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time.

目次

Introduction. Optical Theory for Semiconductor Characterization. Optical Physics of Semiconductors. Measurement Methods. Case Studies: Photoluminescence Characterization. Case Studies: Raman Characterization. Case Studies: Infrared Characterization. Summary and Future Trends. References. Subject Index.

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詳細情報

  • NII書誌ID(NCID)
    BA21406823
  • ISBN
    • 0125507704
  • 出版国コード
    uk
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    London
  • ページ数/冊数
    x, 220 p.
  • 大きさ
    25 cm
  • 分類
  • 親書誌ID
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