Bridging faults and IDDQ testing

Author(s)

• Malaiya, Yashwant K.
• Rajsuman, Rochit
• IEEE Computer Society. Test Technology Technical Committee

Bibliographic Information

Bridging faults and IDDQ testing

[edited] by Y.K. Malaiya and R. Rajsuman

（IEEE Computer Society Press technology series）

IEEE Computer Society Press, 1992

• : pbk.
• : fiche

Note

"Sponsored by IEEE CS Technical Committee on Test Technology."

Includes bibliographical references

Details

• NCID: BA21628665
• ISBN:
  • 0818632151
  • 081863216X
• LCCN: 92030950
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: vi, 128 p.
• Size: 28 cm
• Classification:
  • LCC : TK7871.99.M44
  • DC20 : 621.3815/48
• Subject Headings:
  • LCSH : Metal oxide semiconductors, Complementary -- Testing -- Data processing
• Parent Bibliography ID:
  • BA13074397