Microbeam analysis 1985 : proceedings of the 20th Annual Conference of the Microbeam Analysis Society, Louisville, Kentucky, 5-9 August 1985

著者

• Microbeam Analysis Society. Conference

書誌事項

Microbeam analysis 1985 : proceedings of the 20th Annual Conference of the Microbeam Analysis Society, Louisville, Kentucky, 5-9 August 1985

John T. Armstrong, editor

San Francisco Press, c1985

注記

Includes bibliographies and index

• NII書誌ID(NCID): BA2197397X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: San Francisco, Calif.
• ページ数/冊数: xv, 384 p.
• 大きさ: 29 cm