Advances in X-ray diffractometry and X-ray spectrography

Author(s)

• Parrish, William

Bibliographic Information

Advances in X-ray diffractometry and X-ray spectrography

edited by William Parrish

Centrex, 1962

Note

A volume of fifteen selected reprints from Philips Laboratories Irvington-on-Hudson, New York, U.S.A.

Details

• NCID: BA22148257
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Eindhoven
• Pages/Volumes: xv, 233 p.
• Size: 24 cm