Scanning electron microscopy/1977/I : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM, March 28 - April 1, 1977 : Sessions held at McCormick INN, Chicago, Illinois

著者

• Scanning Electron Microscope Symposium
• Johari, Om
• IIT Research Institute

書誌事項

Scanning electron microscopy/1977/I : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM, March 28 - April 1, 1977 : Sessions held at McCormick INN, Chicago, Illinois

edited by Om Johari ; sponsored by IIT research Institute

IIT Research Institute, [1977].

• Vol. 1
• Complete Set

タイトル別名

Scanning electron microscopy

SEM

詳細情報

• NII書誌ID(NCID): BA22283161
• ISBN:
  • 0915802112
  • 0915802007
• LCCN: 72626068
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Chicago
• ページ数/冊数: xvi, 783 p.
• 大きさ: 29 cm