Yield and reliability in microwave circuit and system design

Author(s)

• Meehan, Michael D.
• Purviance, John

Bibliographic Information

Yield and reliability in microwave circuit and system design

Michael D. Meehan and John Purviance

（The Artech House microwave library）

Artech House, c1993

Note

Includes bibliographical references and index

Details

• NCID: BA2311696X
• ISBN:
  • 0890065276
• LCCN: 92027018
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: xviii, 276 p.
• Size: 24 cm
• Classification:
  • LCC : TK7876
  • DC20 : 621.381/32
• Subject Headings:
  • LCSH : Microwave integrated circuits -- Design and construction -- Statistical methods
  • LCSH : Engineering design -- Statistical methods
  • LCSH : Computer-aided design
• Parent Bibliography ID:
  • BA00537481