Yield and reliability in microwave circuit and system design

著者

• Meehan, Michael D.
• Purviance, John

書誌事項

Yield and reliability in microwave circuit and system design

Michael D. Meehan and John Purviance

（The Artech House microwave library）

Artech House, c1993

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA2311696X
• ISBN:
  • 0890065276
• LCCN: 92027018
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: xviii, 276 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7876
  • DC20 : 621.381/32
• 件名:
  • LCSH : Microwave integrated circuits -- Design and construction -- Statistical methods
  • LCSH : Engineering design -- Statistical methods
  • LCSH : Computer-aided design
• 親書誌ID:
  • BA00537481