Advanced mathematical tools in metrology
Author(s)
Bibliographic Information
Advanced mathematical tools in metrology
(Series on advances in mathematics for applied sciences, v. 16,
World Scientific, c1994-
- [1]
- 2
- 3
- 4
Available at / 8 libraries
-
Science and Technology Library, Kyushu University
[I]068252194009154,
3027232003300625, 4027232003300702, II025211996002733 -
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Note
[1]: Proceedings of the International Workshop, Villa Gualino, Torino, Italy, October 20-22, 1993
2: Contributions at the International Workshop, Oxford, UK, September, 1995
3: Revised contributions at 3rd International Workshop, Berlin, September, 1996
4: Revised contributions at 4th Workshop, Oxford, UK, April, 1999
Includes bibliographies and index
Description and Table of Contents
- Volume
-
[1] ISBN 9789810217587
Description
Table of Contents
- Solving linear models for data analysis on parallel computers (I. Galligani)
- splines and cauchy principal value integrals (L. Gori)
- performance of standards - intercompassion, treatment of correlations, detection of laboratory offsets and outliers, long-term assessment of an ensemble of standards (R.B. Frenkel). (Part contents).
- Volume
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2 ISBN 9789810226183
Description
Table of Contents
- Constructing and solving mathematical models of measurement, M. Cox
- model parametrization and experimental design, A. Forbes
- the concept of the small displacement torsor in metrology, P. Bourdet
- least squares and the singular value decomposition I, G. Golub
- new methods for nonlinear time series analysis, H. Pompe
- a method and software tool for the exact solution of complex dimensional measurement problems, D. Sourlier
- characterization of 3D surface roughness, P. Scott
- statistical problems in calibration design, M. Dell'Isola
- statistical calculations for radiation standards, S. Duane
- comparison of numerical methods to solve the nonlinear problem of volume measurement by means of gas expansion, P. Ciarlini
- reconstruction algorithms for optical tomography, R. Model
- and other papers.
- Volume
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3 ISBN 9789810229184
Description
Table of Contents
- Parameter estimation as illposed inverse problems - theory and numerical methods, K. Kunisch
- wavelet methods in signal processing, P. Maass
- bootstrap technique, P. Ciarlini
- the technologically and topologically related surface model - 13 constraints for dimensioning, tolerancing and inspection, A. Clement et al
- an approximation method for the linearization of 3D metrology problems, L. Mathieu et al
- software problems in calibration service - a case study, D. Richter et al
- reference data sets for testing software used in metrology, M.G. Cox et al
- quality of experimental data in hydrodynamic research, M. Masia et al
- mathematical methods for data analysis in medical applications, J. Honerkamp
- dipole estimation for MCG-data, E. Krause
- identification of distributed parameters - an overview, J. Sprekels
- robust alternatives to least squares, W. Stahel
- high-dimensional empirical linear prediction, K. Liu
- and other papers. (Part contents).
- Volume
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4 ISBN 9789810242169
Description
Table of Contents
- An efficient algorithm for template matching, I.J. Anderson et al
- an application of bootstrap regression to metrological data with errors in both variables, P. Ciarlini and G. Regoliosi
- evaluation of lateral shearing interferograms, C. Elster
- fusing prior calibration information in metrology data analysis, A.B. Forbes
- software engineering related standards and guidelines for metrology, N. Greif and D. Richter
- virtual testing - interaction with a composite model using the Internet, N.J. McCormick
- mathematical problems in the definition of standards based on scales - the case of temperature, F. Pavese
- discussion of methods for the assessment of uncertainties in Monte Carlo particle transport calculations, B.R.L. Siebert
- some robust methods for fitting parametrically defined curves or surfaces to measured data, G.A. Watson. (Part contents)
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