Advanced mathematical tools in metrology
著者
書誌事項
Advanced mathematical tools in metrology
（Series on advances in mathematics for applied sciences, v. 16,
World Scientific, c1994-
- [1]
- 2
- 3
- 4
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注記
[1]: Proceedings of the International Workshop, Villa Gualino, Torino, Italy, October 20-22, 1993
2: Contributions at the International Workshop, Oxford, UK, September, 1995
3: Revised contributions at 3rd International Workshop, Berlin, September, 1996
4: Revised contributions at 4th Workshop, Oxford, UK, April, 1999
Includes bibliographies and index
内容説明・目次
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[1] ISBN 9789810217587
内容説明
This workshop should interest researchers and others involved with high-precision measurements and the development of mathematical tools for this purpose. Advances in metrology depend on improvements in scientific and technical knowledge, the quality of instruments, a better use of advanced mathematical tools and the development of new ones. A tradition of close co-operation between metrologists and mathematicians, while found elsewhere, is lacking in Italy. This workshop wishes to start such a co-operation by providing a common meeting ground. Several industrial sectors, particularly those of instrumentation and software, are likely to benefit from this process, since metrology has a high impact on the overall quality of industrial products and applied mathematics is becoming increasingly important in industrial processes.
目次
- Solving linear models for data analysis on parallel computers (I. Galligani)
- splines and cauchy principal value integrals (L. Gori)
- performance of standards - intercompassion, treatment of correlations, detection of laboratory offsets and outliers, long-term assessment of an ensemble of standards (R.B. Frenkel). (Part contents).
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2 ISBN 9789810226183
内容説明
This work details the proceedings from the Euroconference in Oxford on the subject of advanced mathematical tools in metrology.
目次
- Constructing and solving mathematical models of measurement, M. Cox
- model parametrization and experimental design, A. Forbes
- the concept of the small displacement torsor in metrology, P. Bourdet
- least squares and the singular value decomposition I, G. Golub
- new methods for nonlinear time series analysis, H. Pompe
- a method and software tool for the exact solution of complex dimensional measurement problems, D. Sourlier
- characterization of 3D surface roughness, P. Scott
- statistical problems in calibration design, M. Dell'Isola
- statistical calculations for radiation standards, S. Duane
- comparison of numerical methods to solve the nonlinear problem of volume measurement by means of gas expansion, P. Ciarlini
- reconstruction algorithms for optical tomography, R. Model
- and other papers.
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3 ISBN 9789810229184
内容説明
This book is of interest to researchers in universities, research centres and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to whoever is working in the development of these mathematical tools. Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality as well in a better use of advanced mathematical tools and in the development of new ones. In this book scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products and applied mathematics is becoming more and more important in industrial processes.
目次
- Parameter estimation as illposed inverse problems - theory and numerical methods, K. Kunisch
- wavelet methods in signal processing, P. Maass
- bootstrap technique, P. Ciarlini
- the technologically and topologically related surface model - 13 constraints for dimensioning, tolerancing and inspection, A. Clement et al
- an approximation method for the linearization of 3D metrology problems, L. Mathieu et al
- software problems in calibration service - a case study, D. Richter et al
- reference data sets for testing software used in metrology, M.G. Cox et al
- quality of experimental data in hydrodynamic research, M. Masia et al
- mathematical methods for data analysis in medical applications, J. Honerkamp
- dipole estimation for MCG-data, E. Krause
- identification of distributed parameters - an overview, J. Sprekels
- robust alternatives to least squares, W. Stahel
- high-dimensional empirical linear prediction, K. Liu
- and other papers. (Part contents).
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4 ISBN 9789810242169
内容説明
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools.
目次
- An efficient algorithm for template matching, I.J. Anderson et al
- an application of bootstrap regression to metrological data with errors in both variables, P. Ciarlini and G. Regoliosi
- evaluation of lateral shearing interferograms, C. Elster
- fusing prior calibration information in metrology data analysis, A.B. Forbes
- software engineering related standards and guidelines for metrology, N. Greif and D. Richter
- virtual testing - interaction with a composite model using the Internet, N.J. McCormick
- mathematical problems in the definition of standards based on scales - the case of temperature, F. Pavese
- discussion of methods for the assessment of uncertainties in Monte Carlo particle transport calculations, B.R.L. Siebert
- some robust methods for fitting parametrically defined curves or surfaces to measured data, G.A. Watson. (Part contents)
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