Characterization in compound semiconductor processing

Author(s)

• Strausser, Yale
• McGuire, G. E.

Bibliographic Information

Characterization in compound semiconductor processing

editors, Yale Strausser and Gary E. McGuire ; consulting editor, C.R. Brundle ; managing editor, Lee E. Fitzpatrick

（Materials characterization series）

Butterworth-Heinemann , Manning, c1995

Note

Includes bibliographical references and index

Details

• NCID: BA23896778
• ISBN:
  • 0750692669
• LCCN: 94026832
• Country Code: us
• Title Language Code: eng
• Place of Publication: Boston,Greenwich
• Pages/Volumes: xiv, 199 p.
• Size: 25 cm
• Classification:
  • LCC : QC611.8.C64
  • DC20 : 621.3815/2
• Subject Headings:
  • LCSH : Compound semiconductors
  • LCSH : Compound semiconductors -- Surfaces
• Parent Bibliography ID:
  • BA1935513X