Strausser, Yale

ID:DA08590451

同姓同名の著者を検索

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  • Characterization of organic thin films

    [Abraham Ulman] ; editors, Yale Strausser and Gray E. McGuire

    Momentum Press c2010 Materials characterization series : surfaces, interfaces, thin films / series editors, C. Richard Brundle, Charles A. Evans, Jr.

    所蔵館2館

  • Characterization in compound semiconductor processing

    editors, Yale Strausser and Gary E. McGuire ; consulting editor, C.R. Brundle ; managing editor, Lee E. Fitzpatrick

    Butterworth-Heinemann , Manning c1995 Materials characterization series

    所蔵館6館

  • Characterization in silicon processing

    editor, Yale Strusser ; consulting editors, C.R. Brundle, Gary E. McGuire ; managing editor, Lee E. Fitzpatrick

    Butterworth-Heinemann , Manning c1993 Materials characterization series

    所蔵館2館

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