Characterization in compound semiconductor processing

著者

• Strausser, Yale
• McGuire, G. E.

書誌事項

Characterization in compound semiconductor processing

editors, Yale Strausser and Gary E. McGuire ; consulting editor, C.R. Brundle ; managing editor, Lee E. Fitzpatrick

（Materials characterization series）

Butterworth-Heinemann , Manning, c1995

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA23896778
• ISBN:
  • 0750692669
• LCCN: 94026832
• 出版国コード: us
• タイトル言語コード: eng
• 出版地: Boston,Greenwich
• ページ数/冊数: xiv, 199 p.
• 大きさ: 25 cm
• 分類:
  • LCC : QC611.8.C64
  • DC20 : 621.3815/2
• 件名:
  • LCSH : Compound semiconductors
  • LCSH : Compound semiconductors -- Surfaces
• 親書誌ID:
  • BA1935513X