Applications of optical metrology : techniques and measurements II : [proceedings] : April 7-8, 1983, Arlington, Virginia
著者
書誌事項
Applications of optical metrology : techniques and measurements II : [proceedings] : April 7-8, 1983, Arlington, Virginia
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 416)
S.P.I.E.-- International Society for Optical Engineering, c1983
- pbk.
大学図書館所蔵 件 / 全5件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Includes bibliographical references and index