Electron-beam, x-ray & ion-beam techniques for submicrometer lithographies V : 11-12 March 1986, Santa Clara, California

Bibliographic Information

Electron-beam, x-ray & ion-beam techniques for submicrometer lithographies V : 11-12 March 1986, Santa Clara, California

Phillip D. Blais, chairman/editor

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 632)

SPIE--the International Society for Optical Engineering, c1986

  • pbk.

Other Title

Electron-beam, x-ray, and ion-beam techniques for submicrometer lithographies V

Available at  / 6 libraries

Search this Book/Journal

Note

Includes bibliographies and index

Related Books: 1-1 of 1

  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

Details

Page Top