Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts

著者

• Chen, Michael J. W.
• Thibadeau, Robert
• Society of Photo-optical Instrumentation Engineers

書誌事項

Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts

Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 730）

SPIE--the International Society for Optical Engineering, c1987

• pbk.

注記

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA24042031
• ISBN:
  • 089252765X
• LCCN: 86063732
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: vi, 256 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TS156.2
  • DC19 : 681/.2
• 件名:
  • LCSH : Engineering inspection -- Automation -- Congresses
  • LCSH : Quality control -- Optical methods -- Congresses
• 親書誌ID:
  • BA0022700X