Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan

著者

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Committee
• IEICE. Technical Group on Fault Tolerant Systems

書誌事項

Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan

sponsored by the IEEE Computer Society. Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]

IEEE Computer Society Press, c1994

• : paper
• : microfiche

注記

"IEEE Computer Society Press order number 6690-02"

"IEEE Catalog Number 94TH8016"

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA24287072
• ISBN:
  • 0818666900
  • 0818666919
• LCCN: 94077836
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, CA
• ページ数/冊数: xiv, 392 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381/548
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses