Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan

Author(s)

• Asian Test Symposium
• IEEE Computer Society. Test Technology Technical Committee
• IEICE. Technical Group on Fault Tolerant Systems

Bibliographic Information

Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan

sponsored by the IEEE Computer Society. Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]

IEEE Computer Society Press, c1994

• : paper
• : microfiche

Note

"IEEE Computer Society Press order number 6690-02"

"IEEE Catalog Number 94TH8016"

Includes bibliographies and index

Details

• NCID: BA24287072
• ISBN:
  • 0818666900
  • 0818666919
• LCCN: 94077836
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, CA
• Pages/Volumes: xiv, 392 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381/548
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic test equipment -- Congresses