Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan

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Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan

sponsored by the IEEE Computer Society. Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]

IEEE Computer Society Press, c1994

  • : paper
  • : microfiche

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"IEEE Computer Society Press order number 6690-02"

"IEEE Catalog Number 94TH8016"

Includes bibliographies and index

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内容説明

The November 1994 symposium heard 62 papers on subjects related to testing and design for electronic devices, assemblies, and systems more specifically: fault simulation, on-line testing, test pattern generation and parallel testing, diagnostics, supply current testing, fault modeling, design for te

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