ID:DA08856639
ATS
同姓同名の著者を検索
IEEE c2008
所蔵館1館
sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), Institute of Computing Technology, Chinese Academy of Sciences ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC)
IEEE Computer Society c2007
IEEE Computer Society c2006
IEEE Computer Society c2005
[sponsored by IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University]
IEEE Computer Society c2004
sponsored by Test Technology Technical Council of IEEE Computer Society ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF National Natural Science Foundation of China (NSFC)
IEEE Computer Society c2003
sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan
IEEE Computer Society c2002
所蔵館2館
sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Technical Group on Fault Tolerant Systems ... [et al.]
IEEE Computer Society c2001
: case
所蔵館4館
sponsored by IEEE Computer Society Test Technology Technical Council, Tenth Anniversary Committee of Asian Test Symposium
所蔵館3館
sponsored by IEEE Computer Society Test Technology Technical Council ; Co-Sponsored by National Cheng-Kung University
IEEE Computer Society Press c2000
:case
sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Shanghai University ... [et al.]
IEEE Computer Society Press c1999
sponsored by IEEE Computer Society Test Technology Technical Committee, Computer Chapter of IEEE Singapore Section, Singapore Polytechnic ; in cooperation with National University of Singapore, Nanyang Technological University
IEEE Computer Society Press c1998
sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]
IEEE Computer Society Press c1997
sponsored by the IEEE Computer Society Technical Committee on Test Technology, National Tsing Hua University
IEEE Computer Society Press c1996
sponsored by the IEEE Computer Society's Technical Committee on Test Technology and the VLSI Society of India (VSI)
IEEE Computer Society Press c1995
sponsored by the IEEE Computer Society. Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]
IEEE Computer Society Press c1994
: paper , : microfiche
