Fringe pattern analysis : 8-9 August 1989, San Diego, California

著者

• Reid, Graeme T.
• Society of Photo-optical Instrumentation Engineers
• SPIE Conference on Fringe Pattern Analysis

書誌事項

Fringe pattern analysis : 8-9 August 1989, San Diego, California

Graeme T. Reid, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1163）

SPIE, c1989

注記

"Papers presented at the First SPIE Conference on Fringe Pattern Analysis"--Introd

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA24342840
• ISBN:
  • 0819401994
• LCCN: 89043273
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: vi, 260 p.
• 大きさ: 28 cm
• 分類:
  • LCC : QC415
  • DC20 : 621.36
• 件名:
  • LCSH : Diffraction patterns -- Congresses
  • LCSH : Interferometry -- Congresses
  • LCSH : Image processing -- Congresses
• 親書誌ID:
  • BA0022700X