System test and diagnosis

Author(s)

• Simpson, William Randolph
• Sheppard, John W.

Bibliographic Information

System test and diagnosis

by William R. Simpson and John W. Sheppard

Kluwer Academic, c1994

Note

Includes bibliographical references (p. 361-373) and index

Details

• NCID: BA24858366
• ISBN:
  • 0792394755
• LCCN: 94019248
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: xvi, 382 p.
• Size: 25 cm
• Classification:
  • LCC : TK7870.2
  • DC20 : 620/.0044
• Subject Headings:
  • LCSH : Electronic applaratus and appliances -- Testing
  • LCSH : Electronic circuits -- Testing
  • LCSH : Fault-tolerant computing
  • LCSH : Automatic checkout equipment