Energy-filtering transmission electron microscopy
Author(s)
Bibliographic Information
Energy-filtering transmission electron microscopy
（Springer series in optical sciences, v. 71）
Springer-Verlag, c1995
- pbk
Available at / 28 libraries
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National Institutes of Natural Sciences Okazaki Library and Information Center図
549.97/EN9129725215
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Note
Includes bibliographical references and index
Description and Table of Contents
- Volume
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ISBN 9783540584797
Description
This volume presents a summary of the electron optics, electron-specimen interactions, and operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionizations is of increasing interest for the application of EFTEM in materials science.
- Volume
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pbk ISBN 9783662140550
Description
Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imgaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes EELS, ESI, ESD and REM.
Table of Contents
1. Introduction.- 2. Electron Optics of Imaging Energy Filters.- 3. Plasmons and Related Excitations.- 4. Inner-Shell Ionization.- 5. Quantitative Electron Energy-Loss Spectroscopy.- 6. Electron Spectroscopic Diffraction.- 7. Electron Spectroscopic Imaging.- 8. Energy-Filtered Reflection Electron Microscopy.
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