In situ scanning electron microscopy in materials research
著者
書誌事項
In situ scanning electron microscopy in materials research
Akademie Verlag, c1995
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注記
Includes bibliographical references and indexes
内容説明・目次
内容説明
The authors give an instructive survey of the advancements in Scanning Electron Microscopy (SEM) since there has been a new stage in the development of scanning electron microscopes, as they are equipped with special devices for in situ investigations. Thus a "microlab" now exists inside the electron microscope. Different in situ sample treatments, based on mechanical, thermal and electrical effects, as well as on surface modification by radiation and environmental interaction processes, can be used to quantitatively study reactions at solid surfaces under well-defined external conditions. The objects under investigation can be of many kinds: engineering materials; electrical and magnetic materials (as used in microelectronics); products of technical and chemical industries; minerals; forensic objects; textiles; pharmaceutical; biological and archaeological specimens.
目次
- Fundamentals of SEM - method and equipment
- mechanical loading experiments
- special equipment for mechanical loading
- thermal experiments
- electrical and magnetic experiments
- excess carrier experiments on semiconductors
- laser irradiation experiments
- ion bombardment experiments
- fundamentals and applications of environmental scanning electron miocroscopy. (Part contents).
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