From contamination to defects, faults, and yield loss : simulation and applications

Author(s)

• Khare, Jitendra B.
• Maly, W.

Bibliographic Information

From contamination to defects, faults, and yield loss : simulation and applications

by Jitendra B. Khare, Wojciech Maly

（Frontiers in electronic testing）

Kluwer Academic Publishers, c1996

Note

Includes bibliographical references and index

Details

• NCID: BA27461358
• ISBN:
  • 0792397142
• LCCN: 96005441
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: 150 p.
• Size: 24 cm
• Classification:
  • LCC : TK7874.75
  • DC20 : 621.3815/2/0685
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing
  • LCSH : Integrated circuits -- Very large scale integration -- Defects
  • LCSH : Integrated circuits -- Very large scale integration -- Computer simulation
  • LCSH : Cimputer-aided design
• Parent Bibliography ID:
  • BA19587827