著者
書誌事項
Frontiers in electronic testing
Kluwer Academic Publishers
- タイトル別名
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FRET
この図書・雑誌をさがす
注記
Publisher varies: Springer
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1
- SOC (system-on-a-chip) testing for plug and play test automation
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edited by Krishnendu Chakrabarty
Springer Science+Business Media c2002 Frontiers in electronic testing v. 21
: pbk.
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2
- Soft errors in modern electronic systems
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Michael Nicolaidis, editor
Springer c2011 Frontiers in electronic testing v. 41
cased
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3
- Models in hardware testing : lecture notes of the forum in honor of Christian Landrault
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Hans-Joachim Wunderlich, editor
Springer c2010 Frontiers in electronic testing 43
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4
- Emerging nanotechnologies : test, defect tolerance, and reliability
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Mohammad Tehranipoor, editor
Springer c2008 Frontiers in electronic testing 37
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5
- New methods of concurrent checking
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by Michael Goessel ... [et al.]
Springer c2008 Frontiers in electronic testing 42
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6
- CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test
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Andrei Pavlov, Manoj Sachdev
Springer c2008 Frontiers in electronic testing 40
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7
- Defect-oriented testing for nano-metric CMOS VLSI circuits
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by Manoj Sachdev and José Pineda de Gyvez
Springer c2007 2nd ed. Frontiers in electronic testing 34
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8
- Oscillation-based test in mixed-signal circuits
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Gloria Huertas Sánchez ... [et. al.]
Springer c2006 Frontiers in electronic testing 36
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9
- Digital timing measurements : from scopes and probes to timing and jitter
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Wolfgang Maichen
Springer c2006 Frontiers in electronic testing 33
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10
- The core test wrapper handbook : rationale and application of IEEE Std. 1500
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by Francisco da Silva, Teresa McLaurin, Tom Waayers
Springer c2006 Frontiers in electronic testing 35
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11
- Fault-tolerance techniques for SRAM-based FPGAs
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by Fernanda Lima Kastensmidt, Luigi Carro and Ricardo Reis
Springer c2006 Frontiers in electronic testing 32
: hb
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12
- Advances in electronic testing : challenges and methodologies
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edited by Dimitris Gizopoulos
Springer c2006 Frontiers in electronic testing
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13
- Data mining and diagnosing IC fails
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Leendert M. Huisman
Springer 2005 Frontiers in electronic testing
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14
- Fault diagnosis of analog integrated circuits
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by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha
Springer c2005 Frontiers in electronic testing 30
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15
- Introduction to advanced system-on-chip test design and optimization
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by Erik Larsson
Springer c2005 Frontiers in electronic testing 29
: hb
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16
- Embedded processor-based self-test
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by Dimitris Gizopoulos, Antonis Paschalis and Yervant Zorian
Kluwer Academic c2004 Frontiers in electronic testing 28
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17
- Testing static random access memories : defects, fault models, and test patterns
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by Said Hamdioui
Kluwer Academic c2004 Frontiers in electronic testing 26
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18
- Elements of STIL : principles and applications of IEEE Std. 1450
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by Gregory A. Maston, Tony R. Taylor, Julie N. Villar
Kluwer Academic Publishers c2003 Frontiers in electronic testing 24
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19
- Verification by error modeling : using testing techniques in hardware verification
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by Katarzyna Radecka, Zeljko Zilic
Kluwer Academic c2003 Frontiers in electronic testing 25
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20
- Fault injection techniques and tools for embedded systems reliability evaluation
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edited by Alfredo Benso and Paolo Prinetto
Kluwer Academic Publishers c2003 Frontiers in electronic testing 23
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