From contamination to defects, faults, and yield loss : simulation and applications

著者

• Khare, Jitendra B.
• Maly, W.

書誌事項

From contamination to defects, faults, and yield loss : simulation and applications

by Jitendra B. Khare, Wojciech Maly

（Frontiers in electronic testing）

Kluwer Academic Publishers, c1996

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA27461358
• ISBN:
  • 0792397142
• LCCN: 96005441
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: 150 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7874.75
  • DC20 : 621.3815/2/0685
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing
  • LCSH : Integrated circuits -- Very large scale integration -- Defects
  • LCSH : Integrated circuits -- Very large scale integration -- Computer simulation
  • LCSH : Cimputer-aided design
• 親書誌ID:
  • BA19587827