Iddq testing for CMOS VLSI

Author(s)

• Rajsuman, Rochit

Bibliographic Information

Iddq testing for CMOS VLSI

Rochit Rajsuman

（The Artech House optoelectronics library）

Artech House, c1995

Note

Includes bibliographical references(p.181-185) and index

Details

• NCID: BA27561556
• ISBN:
  • 0890067260
• LCCN: 94021066
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: xii, 193 p.
• Size: 24 cm
• Classification:
  • LCC : TK7871.99.M44
  • DC20 : 621.39/5/0287
• Subject Headings:
  • LCSH : Iddq testing
  • LCSH : Integrated circuits -- Very large scale integration -- Testing
• Parent Bibliography ID:
  • BA13923422