Electron microprobe analysis and scanning electron microscopy in geology
著者
書誌事項
Electron microprobe analysis and scanning electron microscopy in geology
Cambridge University Press, 1996
- :pbk.
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注記
Includes bibliographical references (p.188-198) and index
内容説明・目次
内容説明
This book describes the important techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM), as used in many branches of geology, including mineralogy, petrology, palaeontology and sedimentology. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible to novices, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
目次
- 1. Introduction
- 2. Electron-target interactions
- 3. The electron-optical column
- 4. X-ray spectrometers
- 5. Scanning electron microscopy
- 6. Element mapping
- 7. Qualitative X-ray analysis
- 8. Quantitative X-ray analysis
- 9. Accuracy of X-ray analysis and treatment of results
- 10. Sample preparation
- References
- Index.
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