Economics of electronic design, manufacture, and test
著者
書誌事項
Economics of electronic design, manufacture, and test
（Frontiers in electronic testing）
Kluwer Academic Publishers, [c1994]
- 統一タイトル
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Journal of electronic testing
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注記
"A special issue of Journal of electronic testing: theory and application, vol. 5, nos. 2 & 3, May/August 1994."
Includes bibliographical references and index
内容説明・目次
内容説明
The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect. As a result, the product will be faulty, will require testing and fixing. Where does economics enter this scenario?
Consider the cost of testing and fixing the product. If a manufactured product is grossly faulty, or too many of the products are faulty, the cost of testing and fixing will be high. Suppose we do not like that. We then ask what is the cause of the faulty product. There must be something wrong in the manufacturing process. We trace this cause and fix it. Suppose we fix all possible causes and have no defective products. We would have eliminated the need for testing.
Unfortunately, things are not so perfect. There is a cost involved with finding and eliminating the causes of faults. We thus have two costs: the cost of testing and fixing (we will call it cost-1), and the cost of finding and eliminating causes of faults (call it cost-2). Both costs, in some way, are included in the overall cost of the product. If we try to eliminate cost-1, cost-2 goes up, and vice versa. An economic system of production will minimize the overall cost of the product.
Economics of Electronic Design, Manufacture and Test is a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test, written for inclusion in this book.
目次
A Tale of Two Designs: the Cheapest and the Most Economic.- Test Strategy Planning Using Economic Analysis.- Economic Modeling of Board Test Strategies.- Economics of "Design for Test" to Remain Competitive in The 90s.- The Economics of Scan-Path Design for Testability.- High Level Test Economics Advisor (Hi-TEA).- Multichip Systems Tradeoff Analysis Tool.- Trade-Off Analysis on Cost and Manufacturing Technology of an Electronic Product: Case Study.- Cost Based Surface Mount PCB Design Evaluation.- Sensitivity Analysis in Economics Based Test Strategy Planning.- Improving Quality: Yield Versus Test Coverage.- Boundary Scan in Board Manufacturing.- Comparing Quality Assurance Methods and the Resulting Design Strategies: Experiences from Complex Designs.- Trade-Offs in Scan Path and BIST Implementations for RAMs.- Techniques for Estimating Test Length Under Random Test.- Fuzzy Optimization Models for Analog Test Decisions.- Self-Test of Sequential Circuits with Deterministic Test Pattern Sequences.
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