Test economics and design for testability for electronic circuits and systems
著者
書誌事項
Test economics and design for testability for electronic circuits and systems
（Ellis Horwood series in electrical and electronic engineering）
Ellis Horwood, 1995
大学図書館所蔵 件 / 全2件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Bibliographical references: p. [195]-202
Includes index
入力は遡及データによる
内容説明・目次
内容説明
Providing an examination of the economics of design and test of electronics circuits and systems, this book describes the overall economic effects of design and test decisions facing electronic designers, engineering managers and test engineers at device, board, system and field test stages, and includes issues such as time-to-market and product liability. It also discusses the issues and parameters that can cause variations in test-related costs, and covers cost model creation, and the use/usability of cost models for making design and test decisions.
「Nielsen BookData」 より