Stress-induced phenomena in metallization : third international workshop, Palo Alto, CA June 1995

著者

• Li, Che-Yu
• Ho, P. S.
• Bravman, John

書誌事項

Stress-induced phenomena in metallization : third international workshop, Palo Alto, CA June 1995

editors, Paul S. Ho, John Bravman, Che-Yu Li

（AIP conference proceedings, 373）

American Institute of Physics, c1996

注記

DOE CONF-9506336

Includes bibliographical references and index

内容説明・目次

内容説明

This text is aimed at engineers and research scientists working in the fields of microelectronics and ma terials science. '

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA28019042
• ISBN:
  • 1563964392
• LCCN: 96084949
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: vii, 304 p.
• 大きさ: 25 cm
• 親書誌ID:
  • BA00284604