A probabilistic analysis of test-response compaction
著者
書誌事項
A probabilistic analysis of test-response compaction
IEEE Computer Society Press, c1995
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注記
Includes bibliographical references (p. 89-94)
内容説明・目次
内容説明
Synthesizes recent findings on the chance of missing a faulty circuit when the data from testing microelectronic systems is compacted to be more manageable, a situation known as aliasing. Considers single and multiple stuck-at, delay, and stuck-open faults. Also reviews the testing of VLSI, introduc
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