Proceedings : The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, November 13-15, 1995, Lafayette, Louisiana

著者

• IEEE Computer Society
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• International Workshop on Defect and Fault Tolerance in VLSI Systems

書誌事項

Proceedings : The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, November 13-15, 1995, Lafayette, Louisiana

sponsored by the IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing

IEEE Computer Society Press, c1995

• : microfiche

タイトル別名

95TB100009

注記

Includes bibliographical references and index

"IEEE catalog number 95TB100009"

詳細情報

• NII書誌ID(NCID): BA28647533
• ISBN:
  • 0818671076
  • 0818673826
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, CA. ; Tokyo
• ページ数/冊数: x, 305 p.
• 大きさ: 24 cm