Modeling of film deposition for microelectronic applications

書誌事項

Modeling of film deposition for microelectronic applications

edited by Stephen Rossnagel

(Thin films, v. 22)

Academic Press, c1996

大学図書館所蔵 件 / 20

この図書・雑誌をさがす

注記

Includes bibliographical references and indexes

内容説明・目次

内容説明

Physics of Thin Films is one of the longest running continuing series in thin film science, consisting of 22 volumes since 1963. The series contains quality studies of the properties of various thin filmsmaterials and systems. In order to be able to reflect the development of today's science and to cover all modern aspects of thin films, the series, starting with Volume 20, has moved beyond the basic physics of thin films. It now addresses the most important aspects of both inorganic and organic thin films, in both their theoretical as well as technological aspects. Therefore, in order to reflect the modern technology-oriented problems, the title has been slightly modified from Physics of Thin Films to Thin Films.

目次

M.J. Brett, S.K. Dew, and T.J. Smy, Thin Film Microstructure and Process Simulation Using SIMBAD. S. Hamaguchi, Mathematical Methods for Thin Films Deposition Simulations. C.-C. Fang, V. Prasad, R.V. Joshi, F. Jones, and J.J. Hsieh, A Process Model for Sputter-Deposition of Thin Films Using Molecular Dynamics. T.S. Cale and V. Mahadev, Feature Scale Transport and Reaction during Low Pressure. Chapter References. Author Index. Subject Index.

「Nielsen BookData」 より

関連文献: 1件中  1-1を表示

  • Thin films

    Academic Press

    v. 25

    所蔵館14館

詳細情報

  • NII書誌ID(NCID)
    BA28758239
  • ISBN
    • 0125330227
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    San Diego ; Tokyo
  • ページ数/冊数
    xiv, 291 p., [3] p. of plates
  • 大きさ
    24 cm
  • 件名
  • 親書誌ID
ページトップへ