Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits

著者

• International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Ong, Soon Huat
• Radhakrishnan, M. K.
• IEEE Singapore Section. Reliability/CPMT/EDA Chapter
• IEEE Electron Devices Society
• National University of Singapore. Centre for IC Failure Analysis and Reliability
• Institute of Microelectronics
• Magnetics Technology Centre

書誌事項

Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits

edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, Singapore

Institute of Electrical and Electronics Engineers, c1995

タイトル別名

95TH8113

注記

"IPFA '95 proceedings"--Cover

"IEEE catalog no. 95TH8113"--Cover

"27 November - 1 December 1995, Shangri-La Hotel, Singapore"--Cover

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA28811400
• ISBN:
  • 0780327977
• LCCN: 95078165
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: 230 p.
• 大きさ: 30 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.3815
• 件名:
  • LCSH : Integrated circuits -- Defects -- Congresses
  • LCSH : Integrated circuits -- Testing -- Congresses