Proceedings : International Test Conference 1996

Author(s)

Bibliographic Information

Proceedings : International Test Conference 1996

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

International Test Conference, c1996

  • : soft
  • : case
  • :microfiche
  • :CD-ROM

Other Title

ITC : International Test Conference 1996

1996 IEEE International Test Conference

Test and design validity

96CH35976

Available at  / 9 libraries

Search this Book/Journal

Note

"October 20-25, 1996, Sheraton Washington Hotel, Washington, D.C. USA"--Cover

"IEEE Catalog Number 96CH35976."--T.p. verso

Includes bibliographies and index

Description and Table of Contents

Description

ITC is the World's largest premier technical conference on the testing and total quality of integrated electronics and the assenblies and systems that are based on them.

by "Nielsen BookData"

Details

Page Top