Proceedings : International Test Conference 1996
Author(s)
Bibliographic Information
Proceedings : International Test Conference 1996
International Test Conference, c1996
- : soft
- : case
- :microfiche
- :CD-ROM
- Other Title
-
ITC : International Test Conference 1996
1996 IEEE International Test Conference
Test and design validity
96CH35976
Available at / 9 libraries
-
No Libraries matched.
- Remove all filters.
Note
"October 20-25, 1996, Sheraton Washington Hotel, Washington, D.C. USA"--Cover
"IEEE Catalog Number 96CH35976."--T.p. verso
Includes bibliographies and index
Description and Table of Contents
Description
ITC is the World's largest premier technical conference on the testing and total quality of integrated electronics and the assenblies and systems that are based on them.
by "Nielsen BookData"