Proceedings : International Test Conference 1996
著者
書誌事項
Proceedings : International Test Conference 1996
International Test Conference, c1996
- : soft
- : case
- :microfiche
- :CD-ROM
- タイトル別名
-
ITC : International Test Conference 1996
1996 IEEE International Test Conference
Test and design validity
96CH35976
大学図書館所蔵 件 / 全9件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
"October 20-25, 1996, Sheraton Washington Hotel, Washington, D.C. USA"--Cover
"IEEE Catalog Number 96CH35976."--T.p. verso
Includes bibliographies and index
内容説明・目次
内容説明
ITC is the World's largest premier technical conference on the testing and total quality of integrated electronics and the assenblies and systems that are based on them.
「Nielsen BookData」 より