Transmission electron microscopy : physics of image formation and microanalysis
Author(s)
Bibliographic Information
Transmission electron microscopy : physics of image formation and microanalysis
（Springer series in optical sciences, v. 36）
Springer, c1997
4th ed
Available at / 29 libraries
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National Institutes of Natural Sciences Okazaki Library and Information Center図
425.9/TR9131521214
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The Institute for Solid State Physics Library. The University of Tokyo.図書室
425.8:S5:36e17210127986
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Note
Includes bibliographical references (p.[495]-569) and index
Description and Table of Contents
Description
This text presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.
Table of Contents
- Particle optics of electrons
- wave optics of electrons
- elements of a transmission electron microscope
- electron-specimen interactions
- scattering and phase contrast for amorphous specimens
- theory of electron diffraction
- electron diffraction modes and applications
- imaging of crystalline specimens and their defects
- elemental analysis by X-Ray and electron energy-loss spectroscopy
- specimen damage by electron irradiation.
by "Nielsen BookData"