Conference proceedings, 1997 International Conference on Indium Phosphide and Related Materials, 11-15 May 1997, Tara Hyanns Hotel and Resort, Hyannis, Cape Cod, Massachusetts, USA

書誌事項

Conference proceedings, 1997 International Conference on Indium Phosphide and Related Materials, 11-15 May 1997, Tara Hyanns Hotel and Resort, Hyannis, Cape Cod, Massachusetts, USA

sponsored by the IEEE Lasers and Electro-Optics Society and the IEEE Electron Devices Society

IEEE Service Center, c1997

  • : soft.
  • : case.

タイトル別名

1997 IEEE 9th International Conference on Indium Phosphide & Related Materials

97CH36058 97CB36058

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注記

"IEEE catalog #97CH36058"

内容説明・目次

内容説明

This text examines test structures for microelectronic devices, their recent progress and future directions. Topics highlighted include: process characterization, dimensional measurements, interconnection, material characterization, reliability, device characterization and statistics.

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