Proceedings, 15th IEEE VLSI Test Symposium : April 27-May 1, 1997, Monterey, California

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Proceedings, 15th IEEE VLSI Test Symposium : April 27-May 1, 1997, Monterey, California

sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section

IEEE Computer Society Press, c1997

• : pbk

Other Title

VTS '97

Note

"Sponsered by IEEE Computer Society Technical Committee on Test Technology ..."--Cover

Includes bibliographical references and index

"IEEE Computer Society Press order number PR07810"--T.p. verso

"IEEE order plan catalog number 97TB100125"--Back cover

Details

• NCID: BA33983755
• ISBN:
  • 0818678100
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxxii, 466 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses