Introduction to scanning transmission electron microscopy

Author(s)

• Keyse, Robert J.
• Garratt-Reed, Anthony J.
• Goodhew, Peter J.
• Lorimer, G. W.
• Royal Microscopical Society

Bibliographic Information

Introduction to scanning transmission electron microscopy

Robert J. Keyse ... [et al.]

（Royal Microscopical Society microscopy handbooks, 39）

BIOS Scientific, 1998

Note

Includes bibliographical references and index

Publisher varies: Taylor & Francis

Transferred to digital printing 2008

Description and Table of Contents

Description

STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

Table of Contents

• Why STEM? - STEM versus TEM
• STEM Optics
• The specimen
• Imaging in the STEM
• Diffraction in the STEM
• Microanalysis in the STEM
• Mapping in the STEM
• Limits to STEM and advanced STEM
• Glossary
• Further reading
• Index

by "Nielsen BookData"

Details

• NCID: BA34704085
• ISBN:
  • 1859960669
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Oxford
• Pages/Volumes: xii, 114 p.
• Size: 24 cm
• Classification:
  • DC21 : 502.825
• Subject Headings:
  • LCSH : Scanning electron microscopy
  • LCSH : Transmission electron microscopy
• Parent Bibliography ID:
  • BA23843410