A unified approach for timing verification and delay fault testing

Author(s)

• Sivaraman, Mukund
• Strojwas, Andrzej J.

Bibliographic Information

A unified approach for timing verification and delay fault testing

Mukund Sivaraman and Andrzej J. Strojwas

Kluwer Academic, c1998

Note

Includes bibliographical references (p. [139]-152) and index

Details

• NCID: BA35140407
• ISBN:
  • 0792380797
• LCCN: 97042061
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: xv, 155 p.
• Size: 25 cm
• Classification:
  • LCC : TK7874.65
  • DC21 : 621.39/5/0287
• Subject Headings:
  • LCSH : Digital integrated circuits -- Design and construction -- Data processing
  • LCSH : Digital integrated circuits -- Testing
  • LCSH : Electric fault location
  • LCSH : Integrated circuits -- Verification