Proceedings, 16th IEEE VLSI Test Symposium : April 26-30, 1998, Monterey, California

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Proceedings, 16th IEEE VLSI Test Symposium : April 26-30, 1998, Monterey, California

sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section

IEEE Computer Society, c1998

タイトル別名

16th IEEE VLSI Test Symposium

VTS98

注記

"Sponsered by IEEE Computer Society Technical Committee on Test Technology ..."--Cover

Includes bibliographical references and index

"IEEE Computer Society order number PR08436"--T.p. verso

"IEEE order plan catalog number 98TB100231"--Back cover

内容説明・目次

内容説明

This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA37201717
• ISBN:
  • 0818684364
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxxx, 472 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses