Proceedings, 16th IEEE VLSI Test Symposium : April 26-30, 1998, Monterey, California

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Proceedings, 16th IEEE VLSI Test Symposium : April 26-30, 1998, Monterey, California

sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section

IEEE Computer Society, c1998

Other Title

16th IEEE VLSI Test Symposium

VTS98

Note

"Sponsered by IEEE Computer Society Technical Committee on Test Technology ..."--Cover

Includes bibliographical references and index

"IEEE Computer Society order number PR08436"--T.p. verso

"IEEE order plan catalog number 98TB100231"--Back cover

• NCID: BA37201717
• ISBN:
  • 0818684364
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xxxx, 472 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses