Frontiers in reliability : a volume commemorating the first 25 years of the Indian Association for Productivity, Quality and Reliability
著者
書誌事項
Frontiers in reliability : a volume commemorating the first 25 years of the Indian Association for Productivity, Quality and Reliability
（Series on quality, reliability, and engineering statistics, v. 4）
World Scientific, c1998
大学図書館所蔵 全15件
注記
Includes bibliographical references and index
内容説明・目次
内容説明
This volume presents recent results in reliability theory by leading experts in the world. It will prove valuable for researchers, and users of reliability theory. It consists of refereed invited papers on a broad spectrum of topics in reliability. The subjects covered include Bayesian reliability, Bayesian reliability modeling, confounding in a series system, DF tests, Edgeworth approximation to reliability, estimation under random censoring, fault tree reduction for reliability, inference about changes in hazard rates, information theory and reliability, mixture experiment, mixture of Weibull distributions, queuing network approach in reliability theory, reliability estimation, reliability modeling, repairable systems, residual life function, software spare allocation systems, stochastic comparisons, stress-strength models, system-based component test plans, and TTT-transform.
目次
- A Bayesian approach using nonhomogeneous poisson processes for software reliability models, J.A. Achcar et al
- the class of life distributions that are Laplace order dominated by the exponential law and its ramifications, S.K. Basu and M. Mitra
- on smoothed functional estimation under random censoring, Y.P. Chaubey and P.K. Sen
- inference about sharp changes in hazard rates, J.K. Ghosh et al
- stochastic comparisons of spacings and order statistics, S.C. Kochar
- statistical approaches to modelling and estimating software reliability, T.K. Nayak
- parameter estimation in software reliability growth models, L.D. Ries and A.P. Basu
- role of stochastic orderings in spare allocation in systems, H. Singh
- ordinary and Bayesian approach to life testing using the extreme value distribution, C.P. Tsokos
- fault tree reduction for reliability analysis and improvement, M. Xie et al. (Part contents).
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