Research perspectives and case studies in system test and diagnosis

著者

• Sheppard, John W.
• Simpson, William Randolph

書誌事項

Research perspectives and case studies in system test and diagnosis

by John W. Sheppard and William R. Simpson

（Frontiers in electronic testing）

Kluwer Aacdemic Publishers, c1998

注記

Based on a workshop held in Alexandria, Virginia in April 1998

Includes bibliographical references and index

• NII書誌ID(NCID): BA3966084X
• ISBN:
  • 0792382633
• LCCN: 98036298
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: xiv, 232 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7870
  • DC21 : 621.3815/48
• 件名:
  • LCSH : Electronic apparatus and appliances -- Testing
  • LCSH : Electric fault location
  • LCSH : Systems engineering
• 親書誌ID:
  • BA19587827