Proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2-4, 1998, Austin, Texas

著者

• IEEE Computer Society
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society. Test Technology Technical Committee
• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

書誌事項

Proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2-4, 1998, Austin, Texas

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee

IEEE Computer Society, c1998

• : microfiche

タイトル別名

1998 proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

注記

Includes bibliographical references and index

"IEEE Computer Society Press order number PR08832"

"IEEE order plan catalog number 98EX223"

内容説明・目次

内容説明

This volume covers topics including: yield and defect density; reliability enhancement; defect and fault analysis; testing techniques; fault diagnosis; fault-tolerant designs; high-level synthesis of reliable systems; and yield and reliability issues of analogue and mixed signal circuits.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA3973676X
• ISBN:
  • 0818688327
  • 0818688351
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, CA. ; Tokyo
• ページ数/冊数: xi, 355 p.
• 大きさ: 23 cm