Proceedings, 17th IEEE VLSI Test Symposium : April 25-29, 1999, Dana Point, California

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Committee

書誌事項

Proceedings, 17th IEEE VLSI Test Symposium : April 25-29, 1999, Dana Point, California

sponsored by IEEE Computer Society Test Technology Technical Council

IEEE Computer Society, c1999

タイトル別名

17th IEEE VLSI Test Symposium

VTS99

注記

"Sponsered by IEEE Computer Society Technical Committee on Test Technology ..."--Cover

Includes bibliographical references and index

IEEE Computer Society order number PR00146

IEEE order plan catalog number PR00146

内容説明・目次

内容説明

The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA41906090
• ISBN:
  • 076950146X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif. ; Tokyo
• ページ数/冊数: xxxii, 488 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses