1999 IEEE International Reliability Physics Symposium proceedings : 37th annual, San Diego, California, March 23-25, 1999
著者
書誌事項
1999 IEEE International Reliability Physics Symposium proceedings : 37th annual, San Diego, California, March 23-25, 1999
Institute of Electrical and Electronics Engineers, c1999
- : soft.
- : case.
- タイトル別名
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99CH36296
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注記
Includes bibliographies
"IEEE Catalog No. 99CH36296"
内容説明・目次
内容説明
This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytical techniques and ways to build in reliability.
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